二极管伏安特性曲线测试仪毕业设计论文docx.docx

南 昌 工 程 学 院毕 业 设 计 (论 文)信息工程学院系（院） 应用电子技术专业毕业设计（论文）题目 二极管伏安特性曲线测试仪学生姓名： 林世远 班 级：13应用电子技术专业2班学 号： 2013010656 指导教师： 钱立峰 完成日期2016年5 月25日Nanchang Institute of TechnologyGraduation ThesisTitle Diode volt ampere characteristic curve measuring instrumentName Lin ShiyuanMajorApplication of electronic technology Student No. 2013010656AdvisorQian LifengDateMay. 25th, 2016 Department of Information Engineering二极管伏安特性曲线测试仪Diode volt ampere characteristic curve measuring instrument总计 毕业设计（论文） 60 页表 格 9 个插 图 21 幅摘要本文提出了一种关于二极管伏安特性曲线的测试电路，在本文设计中主要涉及二极管的正向的伏安特性曲线测试的设计思路。该设计电路的硬件方面主要STC12C5A60S2组成的单片机最小系统，V/I转换电路模块，DA转换电路模块，单片机内部的AD转换模块，放大电路及LCD12864显示电路组成。主要的思路是通过TLV5616组成的DA转换电路与其设定的参考电压得出的相关的模拟电压，再经过V/I转换电路后得到通过二极管的电压，该电压再经过放大电路的相应放大若干倍输入到单片机内部的AD进行采集，最后在LCD12864显示屏上显示出相应的特性。该设计方案实现了比较客观的展现出二极管的伏安特性，具有直观性，方便性和实用性。关键词：二极管伏安特性 ； V/I转换电路 ； LCD12864 ； TLV5616AbstractThis paper proposes a about diode volt-ampere characteristic curve of the test circuit, in this paper, mainly involved in the design of positive volt-ampere characteristic curve of the diode test design ideas. The design of the hardware circuit is mainly composed of single chip microcomputer minimum system composed of STC12C5A60S2, V/I conversion circuit module, DA conversion circuit module, MCU internal AD conversion module, amplifying circuit and LCD12864 display circuit.Main idea is through DA conversion circuit composed of TLV5616 is related to its set the reference voltage of the analog voltage, and then after the V/I conversion circuit to get through the diode current, the current through the amplifier circuit to the corresponding amplifier to capture several times the input to the single chip microcomputer internal AD, the last on the LCD12864 screen shows the corresponding features. This design has realized the relatively objective display volt-ampere characteristics of diode, intuitive, convenient and practical.Key Words:Di