defects identification and effects of annealing on lu2(1-x)y2xsio5 (lyso) single crystals for scintillation application缺陷识别和退火对lu2(1 - x)y2xsio5(lyso)单晶闪烁的应用程序.pdf

Materials 2011, 4, 1224-1237; doi:10.3390/ma4071224 OPEN ACCESS materials ISSN 1996-1944 /journal/materials Article Defects Identification and Effects of Annealing on Lu2(1-x)Y2xSiO5 (LYSO) Single Crystals for Scintillation Application Samuel Blahuta 1,2,*, Aur茅lie Bessi猫re 1, Bruno Viana 1, Vladimir Ouspenski 2, Eric Mattmann 2, 1 1 Julien Lejay and Didier Gourier 1 Ecole Nationale Sup茅rieure de Chimie de Paris (Chimie ParisTech) et Universit茅 Pierre et Marie Curie, Laboratoire de Chimie de la Mati猫re Condens茅e de Paris, UMR鈥揅NRS 7574, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France; E-Mails: aurelie-bessiere@chimie-paristech.fr (A.B.); bruno-viana@chimie-paristech.fr (B.V.); julien -lejay@chimie-paristech.fr (J.L.); didier-gourier@chimie-paristech.fr (D.G.) 2 Saint-Gobain Cristaux et D茅tecteurs, 104 Route de Larchant, 77140 St-Pierre-l猫s-Nemours, France; E-Mails: Vladimir.VO.Ouspenski@ (V.O.); eric.mattmann@ (E.M.) * Author to whom correspondence should be addressed; E-Mail: samuel-blahuta@chimie-paristech.fr; Tel.: +33-1-53-73-79-39; Fax: +33-1-46-34-74-89. Received: 19 May 2011; in revised form: 21 June 2011 / Accepted: 23 June 2011 / Published: 1 July 2011 Abstract: The nature, properties and relative concentrations of electronic defects were investigated by Thermoluminescence (TL) in Lu2(1-x)Y2xSiO5 (LYSO) single crystals. Ce and Tb-doped single crystals, grown by the Czochralski technique (CZ), revealed similar traps in TL.